Device validation/characterization, functional test at ATE, structural test, and SLT will continue to find use in the 21st century. But just as Star Trek had the next generation, so, too, must test.

So we need a new model of test that involves interacting with functional interfaces with the chip. Cavagnaro: We moved away from functional tests a long time ago. We’ve used structural-based ...

SiConic TE offers test engineers the ability to bring up and validate structural and functional tests over high-speed I/O interfaces in a scalable bench environment, ...