FREMONT, Calif.--July 12, 2006 --Genesys Testware, Inc., a leading supplier of yield, quality and cost optimization tools for nanometer ICs, announced today the addition of top-down insertion of test ...

“Not since flash memory was introduced in 1988 has the industry seen a new, high-density memory technology,” said Glen Hawk, Numonyx vice president and general manager of the Embedded Business ...