A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne.

TOKYO--(Marketwired - Jul 8, 2013) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has entered the market for testing system-on-chip (SoC) mobile ...