The experimental results show that this method can effectively integrate the channel attention module and the fully convolutional autoencoder. Although it is an unsupervised feature learning model, it ...

Accurate classification of wafer map defects is essential for improving semiconductor manufacturing processes and reducing costs. However, class imbalance in defect datasets poses a significant ...

An advanced generalized autoencoder for dimensionality reduction and feature extraction AutoencoderZ is an advanced Autoencoder model designed for dimensionality reduction of various data types, such ...

Vibration signals are generally utilized for machinery fault diagnosis to perform timely maintenance and then reduce losses. Thus, the feature extraction on one-dimensional vibration signals often ...