In only its second year, the International Logic Olympiad is already booming as logic becomes more and more crucial in our ...

As CMOS device sizes continue to scale down, radiation-related reliability issues are of ever-growing concern. Single event double node upsets (SEDUs) in sequential logic and single event transients ...

The existing SAT-resistant logic locking methods provide a tradeoff between security and effectiveness and require a significant design overhead. In this article, a novel gate replacement-based ...